
International Workshop on High throughput Correlative Materials Characterization
Future of Materials Research
University of Hyderabad - an Institution of Eminence, has recently established state-of-the-art advanced materials characterization facilities that include analytical TEM, dual-beam FIB, micro-XRD, and more to accelerate materials development. To kick off the activities, an international workshop on High Throughput Correlative Materials Characterization (HTCMC) – 2026 will be organized at the University of Hyderabad during February 10-11, 2026. Globally renowned experts in the area of materials characterization from academia and industry will cover the theoretical and practical aspects of advanced materials characterization. The event also includes hands-on demonstration sessions on advanced characterization equipment and test data analysis. The workshop will greatly benefit research scholars, practicing engineers, scientists, faculty, and master’s students in the area of materials characterization.

Scope & Topics
This event covers advanced characterization and analysis techniques used in modern materials research, including Scanning Electron Microscopy (SEM), Focused Ion Beam (FIB) milling, and Transmission Electron Microscopy (TEM).
It also explores Micro X-ray Diffraction, nano- and micro-scale mechanical testing, modelling and simulation approaches, and cutting-edge in-situ TEM techniques to study materials behavior in real time.
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